INSTRUMENT 01

One variable. The entire visible spectrum.

Move the slider. The color you see is the film telling you how thick it is.

film thickness180 nm
peak wavelength540 nm
viewing angle8.0°
40 nm400 nm

Below is a single specimen under fixed illumination. You are changing one thing: the thickness of a transparent thin film, measured in nanometers. Nothing else is touched. No dye is added, no pigment is mixed.

NAC-SPX-000 MATERIAL  TiO₂ thin film on polished Si REFLECTED PEAK Λ VS. FILM THICKNESS  118–340 nm → 442–660 nm
PRESET REGIMES

Five states the film settles into.

Each preset is a named thickness. The sample cross-dissolves between them.

DOCUMENTATION

Every state ships with its numbers.

A color you cannot specify is a color you cannot order. Each regime exposes a spec sheet: peak reflected wavelength and its angular drift, CIE 1931 gamut coordinates with measured tolerance, and a substrate-compatibility table covering silicon, anodized aluminum, soda-lime glass, and PET.

Sheets are issued against the specimen ID shown on the instrument, so the document and the sample on your bench reference the same deposition run.

Download spec sheet
NAC-SPX-DOC MATERIAL  Spec sheet, per regime Λ-PEAK · CIE COORDS · SUBSTRATE MATRIX  PDF · rev. 2026.06